The SmartLearn® Defect Library Advisor (DLA) streamlines the initial sorting of incoming defects, enabling faster creation of defect libraries.
Multiple inspection files can be imported to aggregate defects into the DLA (Defect Library Analysis) groups. This streamlined process removes the need to manually search for individual defects within each inspection file, allowing users to efficiently compile and manage defect data. Defects included in the DLA can be selectively filtered by defect class, making it easier to exclude large volumes of quickly identifiable defect types and focus on more complex issues."
Each system comes equipped with a basic defect grouper, which automatically organizes defects into groups based on attributes like size and grayscale. This initial classification is beneficial for many applications, serving as a solid foundation for users to build and refine their custom defect libraries according to their specific inspection needs.
"For customers operating multiple inspection systems on a single production process, existing classifiers can be seamlessly applied to defects identified on new production lines. This capability accelerates the creation of new defect libraries, helping to streamline classification across production lines while validating the accuracy and effectiveness of the current classifiers.
SmartLearn Defect Library Advisor (DLA) is AMETEK Surface Vision’s advanced defect inspection tool – Find out more by
contacting us.